IOLTS 2006 - Call for Papers

CALL FOR PRESENTATIONS

Scope

The SWTW is the only IEEE/CS sponsored event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking.

Topics for this year will include:

New probe card and contactor technologies
Challenges of 300-mm wafer probing
Monitor and reduction of chip I/O pad damage
Area array and C4 solder bump probing
Parallel, multi-site probing
Probe Card PCB Characterization
Productivity improvements for high volume production
Probe data collection, analysis, and management
Probe Card cleaning, extending card life, improving cost of ownership
Advances in Probe Card Analyzers and metrology tools
Addressing unique probing requirements:
- Copper I/O pads
- RF and microwave
- Mixed signal, low noise, and parametric
- Very high frequency digital
- Probing for Known Good Die
- High power devices
- Probe Potpourri (anything goes)

Submissions

top

Please submit a 250-word abstract for a 25-minute presentation (no technical paper) by March 11, 2006, to abstractsubmission@swtest.org.

The authors of accepted presentations will be notified by April 8, 2006.

Power Point presentation must be received by May 27, 2006.

Contact

top

For more information, please contact either:

William Mann
General Chairman
william.mann@ieee.org

Dr. Jerry Broz
International Test Solutions
Technical Program Chair
jerry.broz@swtest.org

Visit us on the web at:

www.swtest.org

For more information, visit us on the web at: http://www.swtest.org

The Southwest Test Workshop (SWTW 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

CALL FOR PRESENTATIONS
Scope -- Submissions -- Contact
Scope
The SWTW is the only IEEE/CS sponsored event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking. Topics for this year will include: New probe card and contactor technologies Challenges of 300-mm wafer probing Monitor and reduction of chip I/O pad damage Area array and C4 solder bump probing Parallel, multi-site probing Probe Card PCB Characterization Productivity improvements for high volume production Probe data collection, analysis, and management Probe Card cleaning, extending card life, improving cost of ownership Advances in Probe Card Analyzers and metrology tools Addressing unique probing requirements: Copper I/O pads RF and microwave Mixed signal, low noise, and parametric Very high frequency digital Probing for Known Good Die High power devices Probe Potpourri (anything goes)
Submissions	top
Please submit a 250-word abstract for a 25-minute presentation (no technical paper) by March 11, 2006, to abstractsubmission@swtest.org. The authors of accepted presentations will be notified by April 8, 2006. Power Point presentation must be received by May 27, 2006.
Contact	top
For more information, please contact either: William Mann General Chairman william.mann@ieee.org Dr. Jerry Broz International Test Solutions Technical Program Chair jerry.broz@swtest.org Visit us on the web at: www.swtest.org
For more information, visit us on the web at: http://www.swtest.org
The Southwest Test Workshop (SWTW 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).